Fatigue of Flexible and Stretchable Electronic Structures

OYELADE, Omolara Victoria

dc.contributor.author	OYELADE, Omolara Victoria
dc.date.accessioned	2024-05-30T13:10:27Z
dc.date.available	2024-05-30T13:10:27Z
dc.date.issued	2022-08-27
dc.identifier.citation	Comprehensive Structural Integrity, 2nd Edition, vol. 4, pp. 266–285. Oxford: Elsevier.	en_US
dc.identifier.uri	doi:10.1016/B978-0-12-822944-6.00035-9
dc.identifier.uri	http://localhost:8080/xmlui/handle/123456789/1556
dc.description.abstract	Reliability of electronic systems that are used for applications where flexibility and stretchability are required are becoming necessary in this modern world. Since these flexible and stretchable electronic structures are designed to undergo stress-induced deformation during service condition, it is importance to understand their fatigue behavior. In this article, the underlying fatigue behavior of the flexible and stretchable structures is presented. The theories of failure phenomena that occur during fabrication and deformations of these structures are elucidated. The detailed fatigue test and analysis of the structures are then presented before exploring the failure mechanisms and their effects on optoelectronic properties.	en_US
dc.description.sponsorship	Worcester Polytechnic Institute, MA, USA, Pan African Materials Institute (PAMI), World Bank, and African University of Science and Technology (AUST) Abuja, Nigeria	en_US
dc.language.iso	en	en_US
dc.publisher	Elsevier	en_US
dc.subject	Electronic systems, Flexibility, Stretchability, Stress-induced deformation, Fatigue behavior	en_US
dc.title	Fatigue of Flexible and Stretchable Electronic Structures	en_US
dc.type	Book chapter	en_US